ISO 25498 2025.docx

InternationalStandardISO25498Thirdedition2025-05MicrobeamanalysisAnalyticalelectronmicroscopySelectedareaelectrondiffractionanalysisusingatransmissionelectronmicroscopeAnalyseparmicrofaisceauxMicroscopieelectroniqueanalytiqueAnalysepardiffractionparselectiond,aireaumoyend,unmicroscopeelectroniqueentransmissionReferencenumberISO25498:2025(en)COPYRIGHTPROTECTEDDOCUMENT©ISO2025Allrightsreserved.Unlessotherwisespecified,orrequiredinthecontextofitsimplementation,nopartofthispublicationmaybereproducedorutilizedotherwiseinanyformorbyanymeans,electronicormechanical,includingphotocopying,orpostingontheinternetoranintranet,withoutpriorwrittenpermission.PermissioncanberequestedfromeitherISOattheaddressbeloworISO,smemberbodyinthecountryoftherequester.ISOcopyrightofficeCP401Ch.deBlandonnet8CH-1214Vernier,GenevaPhone:+4122749Ol11Email:copyrightiso.orgWebsite:www.iso.orgPublishedinSwitzerlandContentsPageForewordivIntroductionv1 Scope12 Normativereferences13 Terms,definitionsandabbreviations13.1 Termsanddefinitions13.2 Abbreviatedtermsandsymbols34 Principle34.1 General34.2 Spotdiffractionpattern44.3 Kikuchipattern64.4 Diffractionpatternofpolycrystallinespecimen75 Referencematerials86 Apparatus86.1 Transmissionelectronmicroscope(TEM)86.2 RecordingofSAEDpatternsandimages87 Preparationofspecimens98 Procedure98.1 Instrumentpreparation98.2 ProcedureforacquiringSAEDpatternsfromasinglecrystal108.3 Determinationofdiffractionconstant,L129 MeasurementandsolutionoftheSAEDpatterns149.1 Selectionofthebasicparallelogram149.2 Indexingdiffractionspots1510 180oambiguity1611 Uncertaintyestimation1611.1 General1611.2 Uncertaintyincameraconstant1711.3 Calibrationwithareferencematerial1711.4 Uncertaintyind-spacingvalues18Annex A (informative)Interplanarspacingsofreferences20Annex B (informative)SpotdiffractionpatternsofsinglecrystalsforBCC1FCCandHCPstructure21Bibliography42ForewordISO(theInternationalOrganizationforStandardization)isaworldwidefederationofnationalstandardsbodies(ISOmemberbodies).TheworkofpreparingInternationalStandardsisnormallycarriedoutthroughISOtechnicalcommittees.Eachmemberbodyinterestedinasubjectforwhichatechnicalcommitteehasbeenestablishedhastherighttoberepresentedonthatcommittee.Internationalorganizations,governmentalandnon-governmental,inliaisonwithISO,alsotakepartinthework.ISOcollaboratescloselywiththeInternationalElectrotechnicalCommission(IEC)onallmattersofelectrotechnicalstandardization.TheproceduresusedtodevelopthisdocumentandthoseintendedforitsfurthermaintenancearedescribedintheISO/IECDirectives,Part1.Inparticular,thedifferentapprovalcriterianeededforthedifferenttypesofISOdocumentshouldbenoted.ThisdocumentwasdraftedinaccordancewiththeeditorialrulesoftheISO/IECDirectives,Part2(seewww.iso.org/directives).ISOdrawsattentiontothepossibilitythattheimplementationofthisdocumentmayinvolvetheuseof（八）patent(三).ISOtakesnopositionconcerningtheevidence,validityorapplicabilityofanyclaimedpatentrightsinrespectthereof.Asofthedateofpublicationofthisdocument,ISOhadnotreceivednoticeof（八）patent(三)whichmayberequiredtoimplementthisdocument.However,implementersarecautionedthatthismaynotrepresentthelatestinformation,whichmaybeobtainedfromthepatentdatabaseavailableatwww.iso.org/patents.ISOshallnotbeheldresponsibleforidentifyinganyorallsuchpatentrights.Anytradenameusedinthisdocumentisinformationgivenfortheconvenienceofusersanddoesnotconstituteanendorsement.Foranexplanationofthevoluntarynatureofstandards,themeaningofISOspecifictermsandexpressionsrelatedtoconformityassessment,aswellasinformationaboutISO'sadherencetotheWorldTradeOrganization(WTO)principlesintheTechnicalBarrierstoTrade(TBT),SeeWWW.isoQrgisoforeword.htmLThisdocumentwaspreparedbyTechnicalCommitteeISO/TC202,Microbeamanalysis,SubcommitteeSC3,Analyticalelectronmicroscopy.Thisthirdeditioncancelsandreplacesthesecondedition(ISO25498:2018),whichhasbeentechnicallyrevised.Themainchangesareasfollows:一Scopehasbeenrevised;一ISO/IEC17025hasbeenmovedfromnormativereferencestobibliography;一FigUre1hasbeenreplaced;一Subclause6.3hasbeendeleted;一Subclause8.3.6hasbeendeleted,thecontentof8.3.6hasbeenmovedto8.3.2;一SUbClaUSe925hasbeenaddedandthefollowingsubclausehasbeenrenumbered;一CIaUSeIlhasbeenrevised,11.1,11.2,11.3andIl.4havebeenadded;一SUbClaUSeSB41andB42havebeenadded;一BibliographyhasbeenupdatedandISO/IECGuide98-3(GUM:1995)hasbeenadded.Anyfeedbackorquestionsonthisdocumentshouldbedirectedtotheuser'snationalstandardsbody.Acompletelistingofthesebodiescanbefoundatwww.iso.org/membnrs.htmLIntroductionElectrondiffractiontechniquesarewidelyusedintransmissionelectronmicroscopy(TEM)studies.Applicationsincludephaseidentification,determinationofthecrystallographiclatticetypeandlatticeparameters,crystalorientationandtheorientationrelationshipbetweentwophases,phasetransformations,habitplanesanddefec